Barry P. Linder: search on Z-Library

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1

Real-time tool wear monitoring in milling using a cutting condition independent method

Nouri, Mehdi, Fussell, Barry K., Ziniti, Beth L., Linder, Ernst

Journal:

International Journal of Machine Tools and Manufacture

Year:

2015

Language:

english

File:

PDF, 2.40 MB

english, 2015

2

[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Process optimizations for NBTI/PBTI for future replacement metal gate technologies

Linder, Barry P., Dasgupta, A., Ando, T., Cartier, E., Kwon, U., Southwick, R., Wang, M., Krishnan, S. A., Hopstaken, M., Bajaj, M., Pandey, R., Chang, W., Yamashita, T., Gluschenkov, O., Narayanan, V

Year:

2016

Language:

english

File:

PDF, 398 KB

english, 2016

3

Superior PBTI Reliability for SOI FinFET Technologies and Its Physical Understanding

Wang, Miaomiao, Muralidhar, Ramachandran, Stathis, James H., Linder, Barry Paul, Jagannathan, Hemanth, Faltermeier, Jonathan

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 501 KB

english, 2013

4

[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - The effect of interface thickness of high-k/metal gate stacks on NFET dielectric reliability

Linder, Barry P., Cartier, Eduard, Krishnan, Siddarth, Stathis, James H., Kerber, Andreas

Year:

2009

Language:

english

File:

PDF, 250 KB

english, 2009

5

Quantification of effects of season and nitrogen supply on tree below-ground carbon transfer to ectomycorrhizal fungi and other soil organisms in a boreal pine forest

Mona N. Högberg, Maria J. I. Briones, Sonja G. Keel, Daniel B. Metcalfe, Catherine Campbell, Andrew J. Midwood, Barry Thornton, Vaughan Hurry, Sune Linder, Torgny Näsholm, Peter Högberg

Journal:

New Phytologist

Year:

2010

Language:

english

File:

PDF, 393 KB

english, 2010

6

Dielectric breakdown mechanisms in gate oxides

Lombardo, Salvatore, Stathis, James H., Linder, Barry P., Pey, Kin Leong, Palumbo, Felix, Tung, Chih Hang

Journal:

Journal of Applied Physics

Year:

2005

Language:

english

File:

PDF, 2.55 MB

english, 2005

7

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Bias temperature instability in High-κ/metal gate transistors - Gate stack scaling trends

Krishnan, Siddarth, Narayanan, Vijay, Cartier, Eduard, Ioannou, Dimitris, Zhao, Kai, Ando, Takashi, Kwon, Unoh, Linder, Barry, Stathis, James, Chudzik, Michael, Kerber, Andreas, Choi, Kisik

Year:

2012

Language:

english

File:

PDF, 301 KB

english, 2012

8

Quantification of effects of season and nitrogen supply on tree below-ground carbon transfer to ectomycorrhizal fungi and other soil organisms in a boreal pine forest

Mona N. Högberg, Maria J. I. Briones, Sonja G. Keel, Daniel Metcalfe, Catherine Campbell, Andrew J. Midwood, Barry Thornton, Vaughan Hurry, Sune Linder, Torgny Näsholm and Peter Högberg

Journal:

New Phytologist

Year:

2010

Language:

english

File:

PDF, 1.44 MB

english, 2010

9

Interfacial layer optimization of high-k/metal gate stacks for low temperature processing

Barry P. Linder, Vijay Narayanan, Eduard A. Cartier

Journal:

Microelectronic Engineering

Year:

2009

Language:

english

File:

PDF, 330 KB

english, 2009

10

Modeling of energy distributions for plasma implantation

Barry P. Linder, Nathan W. Cheung

Journal:

Surface and Coatings Technology

Year:

2001

Language:

english

File:

PDF, 325 KB

english, 2001

11

Kidney tubule basement membrane alterations in type II membranoproliferative glomerulonephritis

Mark V. Campbell-Boswell, David Linder, Barry R. Naylor, Robert E. Brooks

Journal:

Virchows Archiv

Year:

1979

Language:

english

File:

PDF, 3.10 MB

english, 1979

12

Effects of optical pitch on oculomotor control and the perception of target elevation

Malcolm M. Cohen, Sheldon M. Ebenholtz, Barry J. Linder

Journal:

Attention, Perception, & Psychophysics

Year:

1995

Language:

english

File:

PDF, 991 KB

english, 1995

13

.alpha.-Hydroxynitrosamines: transportable metabolites of dialkylnitrosamines

Gold, Barry, Linder, Wendy B.

Journal:

Journal of the American Chemical Society

Year:

1979

Language:

english

File:

PDF, 280 KB

english, 1979

14

Proteomic Analysis of High-Grade Dysplastic Cervical Cells Obtained from ThinPrep Slides Using Laser Capture Microdissection and Mass Spectrometry

Gu, Ye, Wu, Shiaw-Lin, Meyer, Jane L., Hancock, William S., Burg, Lawrence J., Linder, James, Hanlon, David W., Karger, Barry L.

Journal:

Journal of Proteome Research

Year:

2007

Language:

english

File:

PDF, 686 KB

english, 2007

15

Reactions of alkanediazotic acids at near neutral and basic pH in [ 18 O] H 2 O

Gold, Barry, Deshpande, Ashok, Linder, Wendy, Hines, Lance

Journal:

Journal of the American Chemical Society

Year:

1984

Language:

english

File:

PDF, 834 KB

english, 1984

16

Additions and Corrections - Reactions of Alkanediazotic Acids at Near Neutral and Basic pH in [ 18 O]H 2 O

Gold, Barry, Deshpande, Ashok, Linder, Wendy, Hines, Lance

Journal:

Journal of the American Chemical Society

Year:

1984

Language:

english

File:

PDF, 132 KB

english, 1984

17

[IEEE 2011 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2011.10.16-2011.10.20)] 2011 IEEE International Integrated Reliability Workshop Final Report - Separating NBTI and PBTI effects on the degradation of Ring Oscillator frequency

Linder, Barry P., Kim, Jae-Joon, Rao, Rahul, Jenkins, Keith, Bansal, Aditya

Year:

2011

Language:

english

File:

PDF, 384 KB

english, 2011

18

[IEEE 2013 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2013.4.22-2013.4.24)] 2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT) - Improving and optimizing reliability in future technologies with high-κ dielectrics

Linder, Barry P., Cartier, E., Krishnan, S., Wu, E.

Year:

2013

Language:

english

File:

PDF, 411 KB

english, 2013

19

[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Reliability monitoring ring oscillator structures for isolated/combined NBTI and PBTI measurement in high-k metal gate technologies

Kim, Jae-Joon, Linder, Barry P., Rao, Rahul M., Kim, Tae-Hyoung, Lu, Pong-Fei, Jenkins, Keith A, Kim, Chris H., Bansal, Aditya, Mukhopadhyay, Saibal, Chuang, Ching-Te

Year:

2011

Language:

english

File:

PDF, 522 KB

english, 2011

20

[IEEE 2014 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2014.6.9-2014.6.12)] 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers - Spatial mapping of non-uniform time-to-breakdown and physical evidence of defect clustering

Wu, Ernest Y., Baozhen Li,, Stathis, James H., Linder, Barry, Shaw, Thomas

Year:

2014

Language:

english

File:

PDF, 676 KB

english, 2014

21

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Combined Ramp Voltage Stress and Constant Voltage Stress for optimal BTI voltage acceleration and lifetime modeling

Linder, Barry P., Ando, Takashi

Year:

2014

Language:

english

File:

PDF, 248 KB

english, 2014

22

ECS Transactions [ECS 218th ECS Meeting - Las Vegas, NV (October 10 - October 15, 2010)] - Methodology of ALD HfO

Jagannathan, Hemanth, Clark, Robert D., Consiglio, Steve, Jamison, Paul, Linder, Barry, Hopstaken, Marinus, Leusink, Gert, Paruchuri, Vamsi, Narayanan, Vijay

Year:

2010

Language:

english

File:

PDF, 1020 KB

english, 2010

23

[ECS 210th ECS Meeting - Cancun, Mexico (October 29-November 3, 2006)] ECS Transactions - Charge Defects, Vt Shifts, and the Solution to the High-K Metal Gate n-MOSFET Problem

Guha, Supratik, Narayanan, Vijay, Paruchuri, Vamsi, Linder, Barry, Copel, Matthew, Bojarczuk, Nestor, Kim, Young-Hee, Chudzik, Michael, Wang, Yun, Ronsheim, Paul

Year:

2006

Language:

english

File:

PDF, 206 KB

english, 2006

24

[ECS 212th ECS Meeting - Washington, DC (October 7 - October 12, 2007)] ECS Transactions - Process and Electrical Characteristics of MO-ALD HfO2 Films for High-k Gate Applications Grown in a Production Worthy 300 mm Deposition System

Clark, Robert D., Wajda, Cory S., Leusink, Gert J., Edge, Lisa F., Faltermeier, Johnathan, Jamison, Paul, Linder, Barry P., Copel, Matthew, Narayanan, Vijay, Gribelyuk, Michael A., Loesing, Rainer, Mu

Year:

2007

Language:

english

File:

PDF, 646 KB

english, 2007

25

ECS Transactions [ECS 220th ECS Meeting - Boston, MA (October 9 - October 14, 2011)] - (Invited) Voltage Ramp Stress Based Stress-And-Sense Test Method For Reliability Characterization of Hf-Base High-k/Metal Gate Stacks For CMOS Technologies

Cartier, Eduard, Kerber, Adreas, Krishnan, Siddarth, Linder, Barry, Ando, Takashi, Frank, Martin M., Choi, Kisik, Narayanan, Vijay

Year:

2011

Language:

english

File:

PDF, 726 KB

english, 2011

26

[ECS 215th ECS Meeting - San Francisco, CA (May 24 - May 29, 2009)] ECS Transactions - Electrical and Materials Characterization of Reactive and Co-Sputtered Tantalum Carbide Metal Electrodes for High-K Gate Applications

Edge, Lisa F., Vo, Tuan, Kellock, Andrew J., Linder, Barry P., Bruley, John, Zhu, Yu, DeHaven, Patrick, Paruchuri, Vamsi K., Tsunoda, Takaaki, Venkateshan, Aarthi, Shinde, Sanjay R.

Year:

2009

Language:

english

File:

PDF, 486 KB

english, 2009

27

Biological and chemical studies involving methyl- t -butylnitro-samine, a non-carcinogenic nitrosamine

Gold, Barry, Salmasi, Shahrokh, Linder, Wendy, Althoff, Jurgen

Journal:

Year:

1981

Language:

english

File:

PDF, 294 KB

english, 1981

28

[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements

Stellari, Franco, Jenkins, Keith A., Weger, Alan J., Linder, Barry, Song, Peilin

Year:

2015

Language:

english

File:

PDF, 661 KB

english, 2015

29

Plasma Immersion Ion Implantation for Electronic Materials

Jones, Erin C., Linder, Barry P., Cheung, Nathan W.

Journal:

Japanese Journal of Applied Physics

Year:

1996

File:

PDF, 2.32 MB

1996

30

[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - A critical analysis of sampling-based reconstruction methodology for dielectric breakdown systems (BEOL/MOL/FEOL)

Wu, Ernest, Stathis, James, Li, Baozhen, Linder, Barry, Zhao, Kai, Bonilla, Griselda

Year:

2015

Language:

english

File:

PDF, 1.78 MB

english, 2015

31

[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - Analyzing path delays for accelerated testing of logic chips

Ray, Emily, Linder, Barry, Robertazzi, Raphael, Stawiasz, Kevin, Weger, Alan, Yashchin, Emmanuel, Stathis, James, Song, Peilin

Year:

2015

Language:

english

File:

PDF, 757 KB

english, 2015

32

Performance Degradation Analysis and Hot-Carrier Injection Impact on the Lifetime Prediction of $LC$ Voltage Control Oscillator

Ho, Chih-Hsiang, Jenkins, Keith A., Ainspan, Herschel, Ray, Emily, Linder, Barry P., Song, Peilin

Journal:

IEEE Transactions on Electron Devices

Year:

2015

Language:

english

File:

PDF, 1.36 MB

english, 2015

33

Reduction of Hot Carrier Degradation of FinFETs Due to Short-Pulse Stress

Jenkins, Keith A., Linder, Barry P.

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 516 KB

english, 2015

34

[ASME ASME 2012 International Manufacturing Science and Engineering Conference collocated with the 40th North American Manufacturing Research Conference and in participation with the International Conference on Tribology Materials and Processing - Notre Dame, Indiana, USA (Monday 4 June 2012)] ASME 2012 International Manufacturing Science and Engineering Conference - Estimation of Cutting Force Model Coefficients to Track Wear in Milling Using Bayesian Analysis

Nouri, Mehdi, Fussell, Barry K., Jerard, Robert B., Gao, Lei, Linder, Ernst

Year:

2012

Language:

english

File:

PDF, 1.23 MB

english, 2012

35

Self-Heating Measurement of 14-nm FinFET SOI Transistors Using 2-D Time-Resolved Emission

Stellari, Franco, Jenkins, Keith A., Weger, Alan J., Linder, Barry P., Song, Peilin

Journal:

IEEE Transactions on Electron Devices

Year:

2016

Language:

english

File:

PDF, 2.26 MB

english, 2016

36

[IEEE 2016 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2016.12.3-2016.12.7)] 2016 IEEE International Electron Devices Meeting (IEDM) - Hot carrier effect in ultra-scaled replacement metal gate Sii-xGex channel p-FinFETs

Wang, Miaomiao, Miao, Xin, Stathis, James H, Southwick, Richard, Linder, Barry P., Liu, Derrick, Bao, Ruqiang, Watanabe, Koji

Year:

2016

Language:

english

File:

PDF, 718 KB

english, 2016

37

[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Fundamental statistical properties of reconstruction methodology for TDDB with variability in BEOL/MOL/FEOL applications

Wu, Ernest, Stathis, James, Li, Baozhen, Kim, Andrew, Linder, Barry, Bolam, Ronald, Bonilla, Griselda

Year:

2016

Language:

english

File:

PDF, 2.63 MB

english, 2016

38

[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - A process-variation-cognizant efficient MOL and BEOL TDDB evaluation method

Kim, Andrew, Bolam, Ronald, Li, Baozhen, Linder, Barry, Wu, Ernest

Year:

2017

Language:

english

File:

PDF, 729 KB

english, 2017

39

[ECS 211th ECS Meeting - Chicago, Illinois (May 6-May 10, 2007)] ECS Transactions - Recent Advances in Search for Suitable High-k/Metal Gate Solutions to Replace SiON/Poly-Silicon Gate Stacks in CMOS Devices for 45nm and Beyond Technologies

Linder, Barry, Paruchuri, Vamsi, Narayanan, Vijay, Cartier, Eduard, Bojarczuk, Nestor, Guha, Supratik, Brown, Stephen, Wang, Y

Year:

2007

Language:

english

File:

PDF, 233 KB

english, 2007

40

[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Electromigration characteristics of power grid like structures

Li, Baozhen, Kim, Andrew, McLaughlin, Paul, Linder, Barry, Christiansen, Cathryn

Year:

2018

Language:

english

File:

PDF, 607 KB

english, 2018

41

[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Estimating transistor channel temperature using time-resolved and time-integrated NIR emission

Stellari, Franco, Weger, Alan J., Jenkins, Keith A., Rosa, Giuseppe La, Linder, Barry, Song, Peilin

Year:

2018

Language:

english

File:

PDF, 963 KB

english, 2018

42

[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Long Term NBTI Relaxation Under AC and DC Biased Stress and Recovery

Mataev, Elnatan, Stathis, James, La Rosa, Giuseppe, Linder, Barry P.

Year:

2019

Language:

english

File:

PDF, 824 KB

english, 2019

43

[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Long Term NBTI Relaxation Under AC and DC Biased Stress and Recovery

Mataev, Elnatan, Stathis, James, La Rosa, Giuseppe, Linder, Barry P.

Year:

2019

File:

PDF, 824 KB

2019

44

[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Transformation of Ramped Current Stress V BD to Constant Voltage Stress TDDB T BD

Kim, Andrew, Wu, Ernest, Li, Baozhen, Linder, Barry

Year:

2019

Language:

english

File:

PDF, 750 KB

english, 2019

45

[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Transient self-heating modeling and simulations of back-end-of-line interconnects

Kim, Andrew, Li, Baozhen, Linder, Barry

Year:

2018

Language:

english

File:

PDF, 746 KB

english, 2018

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